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Seminars jointly organized by the IEEE Ottawa AP/MTT, CPMT and EMC Chapters, and the Department of Electronics at Carleton University:


Free admission.
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Technical presentation by Dr. Ray Haythornthwaite, on
"Microelectronics Reliability: It's evolution from Military to Commercial Requirements",
jointly organized by the IEEE Ottawa Reliability, AP/MTT, AESS, EMC, ComSoc, and LEOS Chapters.

Free admission. Light snacks and refreshments will be provided.
Contact :
Raed Abdullah, Chair of IEEE Ottawa Reliability Chapter [ raedabdullah (at) ieee.org ]
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Technical presentation by
Dr. Sergiu Radu, SUN MicroSystems, Menlo Park, CA, on
"Engineering Aspects of Electromagnetic Shielding",
jointly organized by the the IEEE Ottawa AP/MTT Chapter and the IEEE Ottawa EMC Chapter.

Free admission, but is on a first to reply basis. Preference is given to IEEE AP/MTT/EMC society members. Seating is limited. E-mail reservation is required.
Contact :
Dr. Syed Bokhari, Chairman, IEEE Ottawa EMC Chapter [ Syed.Bokhari (at) fidus.ca ], Office:(613) 828-0063 Ext. 377, Cell: (613) 277-9311
Dr. Qiubo Ye, Chairman of the IEEE Ottawa AP/MTT Chapter [ qiubo.ye (at) crc.ca ]
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Technical presentation by
Dr. Masatake Kawada, University of Tokushima, Tokushima, Japan, on
"Development of Diagnosis Techniques for Power Equipment Using Radio Sensing, Computational Electromagnetic Method, and Signal Processing",
jointly organized by the the IEEE Ottawa AP/MTT Chapter, IEEE Ottawa-Montreal DEIS Chapter, IEEE Ottawa IMS Chapter, IEEE Ottawa PES Chapter, and EPMG of INMS/NRC.

Free admission, but registration is required for security reasons. To ensure a seat, please register by e-mailing to the contact below.
No fee at the visitor’s parking. Please respect restricted areas.
Contact :
Mahmoud Abou-Dakka, Chairman, IEEE Ottawa-Montreal DEIS Chapter [ maboudakka (at) ieee.org ]